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NAND Engineering Tester

The JTS450F NAND Engineering Tester delivers high-speed, precise NAND testing for verification, characterization, and failure analysis. Powered by advanced MPSoC technology, it supports real-time pattern generation and programmable power control at speeds up to 3.6 Gbps.

Key Feature

Compact Performance:

Integrated MPSoC architecture for enhanced processing power and flexibility.
Achieves up to 3.6 Gbps high-speed NAND memory testing.
Compact form factor, making it ideal for lab and production environments.

Flexible Environment:

Linux-based platform for developing and executing custom test programs.
Windows-based GUI for intuitive test automation and user-friendly operation.
Supports remote control and scripting for advanced automation.

Real-time Pattern Generator:

Supports AC timing control and vector-based pattern generation for NAND protocol compliance testing.
Implements source synchronous DDR clocking mode for accurate signal acquisition and analysis.
Enables deep pattern memory and data memory for extended test sequences.

Product Table

Specification

Pattern Generator
- Pattern Memory: 1M depth
- Data Buffer Memory(DBM): Total 4GB
- Timing Generator
  - Speed (SDR): 10 – 100MHz
  - Speed (DDR): 1.0GHz - 1.8 GHz
  - Resolution: 1MHz
  - Timing Set: 64 instances(combination of timings)
  - # of Edges for each Timing Set: 64ea
  - Edge Control Resolution: 1 UI (0.278 - 0.57ns)
  - Delay Control Range: 0 - 1ns
  - Delay Control Resolution: 2 ps

Special Functions
- SCA Protocol
- Multi-CH, Multi-Target Testing
- Current Measurement
- Power Up/Down Cycling

Document

JTS450F NAND Engineering Tester (up to 3.6Gbps)

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