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NAND Burn-In Tester

JKI High Speed ​​NAND BI Tester is developed for the purpose of the high speeds NAND test with NAND solution controller at speed (667-1200Mbps) with cost-effective burn-in socket compared to the low test frequency of the existing NAND burn-in tester. 

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Key Features

  • High-Speed

    • At-speed test with cost-effective burn-in socket (667 Mbps ~ 2400 Mbps)

    • Advanced thermal solution to spread out heat of devices for high-speed operation

    • Fast control and gathering data with on-board FPGA

  • Productivity

    • 32 slots with 2 independent chamber, 4608 devices

    • Concurrent test thread per target DUT

  • Reliability

    • Environmental test chambers with accurate and wide range of temperature control(-40℃~125℃)

    • Programmable device power supplies

    • Comply with environment and safety

    • Self-diagnostics & easy maintenances

  • Applications

    • Solution (SoC) based high-speed NAND burn-in test, reliability and qualification test

Product Table
/Specification

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Document

* COPYRIGHT (C)2020 JKI INC. ALL RIGHTS RESERVED *

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