NAND Burn-In Tester
JKI High Speed NAND BI Tester is developed for the purpose of the high speeds NAND test with NAND solution controller at speed (~ 2400Mbps) with cost-effective burn-in socket compared to the low test frequency of the existing NAND burn-in tester.
High Speed NAND Burn-In Tester
Key Features
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High-Speed
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At-speed test with cost-effective burn-in socket (667 Mbps ~ 2400 Mbps)
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Advanced thermal solution to spread out heat of devices for high-speed operation
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Fast control and gathering data with on-board FPGA
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Productivity
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32 slots with 2 independent chamber, 4608 devices
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Concurrent test thread per target DUT
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Reliability
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Environmental test chambers with accurate and wide range of temperature control(-40℃~125℃)
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Programmable device power supplies
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Comply with environment and safety
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Self-diagnostics & easy maintenances
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Applications
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Solution (SoC) based high-speed NAND burn-in test, reliability and qualification test
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