NAND Engineering Tester
The JTS450F NAND Engineering Tester delivers high-speed, precise NAND testing for verification, characterization, and failure analysis.
Powered by advanced MPSoC technology, it supports real-time pattern generation and programmable power control at speeds up to 3.6 Gbs.
JTS450F
NAND Engineering Tester
JTS450F NAND Engineering Tester
Key Features
-
Integrated MPSoC architecture for high performance and flexibility.
-
Up to 3.6 Gbps high-speed NAND testing.
-
Compact form factor for lab and production environments.
Compact Performance
-
Linux-based platform for custom test program development.
-
Windows GUI for intuitive test automation and operation.
-
Remote control and scripting for advanced automation.
Flexible Environment
Real-time Pattern Generator
-
AC timing control and vector-based pattern generation for NAND protocol testing.
-
Source-synchronous DDR clocking for accurate signal acquisition.
-
Deep pattern and data memory for extended test sequences.
Specification
Pattern Generator
-
Pattern Memory: 1M depth
-
Data Buffer Memory(DBM): Total 4GB
Timing Generator
-
Speed (SDR): 10 - 100MHz
-
Speed (DDR): 1.0 GHz - 1.8 GHz
-
Resolution: 1MHz
-
Timing Set: 64 instances(combination of timings)
-
# of Edges for each Timing Set: 64ea
-
Edge Control Resolution: 1 UI (0.278 - 0.57ns)
-
Delay Control Range: 0 - 1ns
-
Delay Control Resolution: 2ps
Additional Function
-
SCA Protocol
-
Current Measurement
-
Power up/down Cycling