NAND Engineering Tester
The JTS450F NAND Engineering Tester delivers high-speed, precise NAND testing for verification, characterization, and failure analysis.
Powered by advanced MPSoC technology, it supports real-time pattern generation and programmable power control at speeds up to 3.6 Gbs.
JTS450F
NAND Engineering Tester
JTS450F NAND Engineering Tester
Key Features
Compact Performance
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Integrated MPSoC architecture for high performance and flexibility.
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Up to 3.6 Gbps high-speed NAND testing.
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Compact form factor for lab and production environments.
Flexible Environment
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Linux-based platform for custom test program development.
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Windows GUI for intuitive test automation and operation.
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Remote control and scripting for advanced automation.
Real-time Pattern Generator
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AC timing control and vector-based pattern generation for NAND protocol testing.
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Source-synchronous DDR clocking for accurate signal acquisition.
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Deep pattern and data memory for extended test sequences.
Specification
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Pattern Generator
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Pattern Memory: 1M depth
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Data Buffer Memory(DBM): Total 4GB
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Timing Generator
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Speed (SDR): 10 – 100MHz
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Speed (DDR): 1.0GHz - 1.8 GHz
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Resolution: 1MHz
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Timing Set: 64 instances(combination of timings)
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# of Edges for each Timing Set: 64ea
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Edge Control Resolution: 1 UI (0.278 - 0.57ns)
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Delay Control Range: 0 - 1ns
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Delay Control Resolution: 2 ps
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Special Function
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SCA Protocol
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Current Measurement
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Power up/down Cycling
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